Your search returned 9 results.

Sort
Results
Detecting Signal-Overshoots for Reliability Analysis in High-Speed System-on-Chips by
  • Nourani, Mehrdad
  • Attarha, Amir R
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Implementing Asic/Memory Integration by System-on Package by
  • Tsai, R. H
  • lin, C.-L
  • Tseng, Kuo-Tai
Source: IEEE Transactions on Components and Packaging Technologies
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
An Embedded Dram with A 143-Mhz Sram Interface Using A Sense-Synchronized Read/Write by
  • Taito, Yasuhiko
  • Arimoto, Kazutami
  • Igaue, Futoshi
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Low-Temperature Capacitor-Over-Interconnect (Coi) Modular Feram for Soc Application by
  • Lung, Hsiang-Lan
  • Lai, S.C
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Generic Soc Qr Array Processor for Adaptive Beam for ming by
  • Lightbody, G
  • Liu, Zhaohui
  • Walke, R
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
System-on-Chip Testability Using Lssd Scan Structures by
  • Zarrineh, Kamran
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Hierarchical System Test By An Ieee 11490.5 Mtm-Bus Slave-Module Interface Core. by
  • Hong, J. H
  • Tsai, C. H
  • Wu, C. W
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
System on Chip Or System on Package? by
  • R.Tummala, Rao
  • K.Madisetti, Vijay
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
System-on-Chip Design:Impact on Education and Research. by
  • De Man, Hugo
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Pages