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Using Bayesian Networks to Predict Software Defects and Reliability by
  • Fenton, N
  • Neil, M
  • Marquez, D
Source: Journal of Risk and Reliability: Proceedings OfI Mech E Part-O
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Measuring Design-Level Cohesion by
  • Bieman, James M
  • Kang, byung-Kyoo
Source: IEEE Transactions on Software Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Measuring Process Consistency Implications for Reducing Software Defects by
  • Kishnan, M. S
  • Keliner, Marc I
Source: IEEE Transactions on Software Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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