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4-Mb Mosfet-Selected /Spl Mu/Trench Phase-Change Memory Experimental Chip by
  • Bedeschi, Ferdinando
  • Bez, Roberto
  • Bonizzoni, Edoardo
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Yield and Matching Implications for Static Ram Memory Array Sense-Amplifier Design by
  • Lovett, Simon J
  • Gibbs, Gary A
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Yield and Speed Optimization of A Latch-Type Voltage Sense Amplifier by
  • Wicht, Berhard
  • Nirschl, Thomas
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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