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Fractured-Weli Performance Under Anomalous Diffusion by
  • Chen, C
  • Roghavan, R
Source: SPE: Reservoir Evaluation and Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Hole Traps in Silicon Dioxides-Part I: Properties by
  • Zhang, Jian F
  • Zhao, Ce Z
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Hole-Traps in Silicon Dioxides-Part Ii: Generation Mechanism by
  • Zhao, C
  • Zhang, F
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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