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		Investigations on Pd Characteristics of Thermal Aged Palm and Corn Oil for Power Trans Former Insulation Applications by Karthik, B Senthilkumar, S Source: Journal of Electrical Engineering and Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Gassing Arc Chamber Wali Material Effect on Post Current-Zero Recovery Voltage Breakdown by Shea, John J Source: IEEE Transactions on Components and Packaging Technologies Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Newlook Atimpact Ionization Part I a Theoryofgain,Nois, Breakdown Probability, andfrequency Response by Mcintyre, R. J Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Breakdown of Crystal Structure in Potato Starch During Gelatinization by Jenkins, Paul J Donald, Athene M Source: Journal of Applied Polymer Science Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Multiserver Systems Subject to Breakdowns: an Empirical Study by King, P.J.B Mitrani, I Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Influence of Dielectric Breakdown on Mosfet Drain Current by Cellere, Giorgio Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Impact Ionization Measurements and Modeling for Power Phemt by Baksht, Tamara Solodky, Sanelia Shapira, Yoram Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Analysis of Surface State and Impact Ionization Effects on Breakdown Charateristics and Gate Lag Phenomena in Narrowly Recessed Gate Gaas Fets by Mitani, Yasutaka Kasai, Daisuke Horio, Kazushige Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Channel Thickness Dependence of Breakdown Dynamic in Inp-Based Lattice-Matched Hemts by Sleiman, Ammar Carlo, Aldo Di Lugli, Paolo Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Pulsed Measurements and Circuit Modeling of Weak and Strong Avalanche Effects in Gaas Mesfets and Hemts by Meneghesso, Gaudenzio Chini, Alessandro Zanoni, Enrico Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Free Energy Loss DuringBreakdown of Liquid Films by Ryley, D.J Tingxiang, Xu Source: International Journal of Heat and Mass Transfer Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		The Breakdown ofLiquid Film in Annular Two-Phase Flow by Hewitt, G. F Lacey, P.M.C Source: International Journal of Heat and Mass Transfer Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Experiments onBreakdown of Laminar Flow in A Parallel-Plate Channel by Beavers, G.S Sparrow, E.M Magnuson, R.A Source: International Journal of Heat and Mass Transfer Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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