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		Scan-Out Power Reduction for Logic Bist by Wang, Senling Sato, Yasuo Kajihara, Seiji Source: IEICE Transactions on Information and Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Data Compression Technique for Built-In Self-Test by Reddy, Sudhakar M Saluja, K. K Karpovsky, Mark Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Adc Bist with on-Chip Ramp Generator by Khatri, R Puradkar, V. P Source: International Journal of Electronics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		An Efficirent Bist Method for Distributed Small Buffers by Jone, Wen-Ben Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Economics of Built-In Self-Test by Ungar, Louis Y Ambler, tony Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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