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Comments on Ternary Scan Design for Vlsi Testability by
  • Molyneaux, Robert F
  • Albicki, Alexaander
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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onDesign of 4-Valued Digital Systems by
  • Wojcik, Anthony S
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Representation of Multivalued Functions UsingDirect Cover Method by
  • Armstrong, James E
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
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Tmlnn: Triple-Valued Or Multiple-Valued Ligic Neural Network. by
  • Shi, H
  • Wang, G
Source: Ieee Transactions on Neural Networks
Material type: Article Article; Format: print
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