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Integrated Circuit Manufacturability the Art of Process and Design Integration by
  • De Gyvez, Jose Pineda [editor]
  • Pradhan, Dhiraj K [editor]
  • IEEE Circuits and Systems Society
Material type: Text Text
Language: English
Publication details: Delhi : IEEE Press/Standard Publishers Distributors, c1999
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.3815 DEG.
Tram: a Design Methodology for High-Performance, Easily Testable, Multimegabit Rams by
  • Pradhan, Dhiraj K
  • Jarwala, Najmi T
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Flip-Trees: Fault-Tolerant Graphs with Wide Containers by
  • Meyer, F.J
  • Pradhan, Dhiraj K
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Dynamic Testing Strategy for Distributed Systems by
  • Meyer, F.J
  • Pradhan, Dhiraj K
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Optimal Unidirectional Error Detecting/Correcting Codes by
  • Bose, B. K
  • Pradhan, Dhiraj K
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Modeling Defect Spatial Distribution by
  • Meyer, F.J
  • Pradhan, Dhiraj K
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
The De Bruijn Multiprocessor Network: a Versatile Paraliel Processing and Sorting Network for Vlsi by
  • Pradhan, Dhiraj K
  • Samatham, Maheswara R
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Sequential Network Design Using Extra Inputs for Fault Detection by
  • Pradhan, Dhiraj K
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Fault-Tolerant Communication Architecture for Distributed Systems by
  • Pradhan, Dhiraj K
  • Reddy, Sudhakar M
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
A Bist Pattern Generator Design for Near-Perfect Fault Coverage by
  • Alaee, Farshid Jandaghi
  • Pradhan, Dhiraj K
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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