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Image Processing and Data Analysis the Multiscale Approach by
  • Starck, J. L [author]
  • Bijaoui, A [author]
  • Murtagh, F [author]
Material type: Text Text
Language: English
Publication details: Cambridge : Cambridge University Press, c1998
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.367 STA.
A New Entropy Measure Based onWavelet Trans for m and Noise Modeling. by
  • Murtagh, F
  • Starck, J. L
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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