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		Oscillation-Test Methodology for Low-Cost Testing of Active Analog Filters. by Arabi, Karim Kaminska, Bozena Source: Ieee Transactions on Instrumentation and Measurement Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		on Chip Testingdata Conveters Using Static Parameters. by Arabi, Karim Kaminska, B Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Bist for D/A Adn A/D Converters. by Rzeszut, Janusz Kaminska, Bozena Arabi, Karim Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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