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An on-Chip March Pattern Generator for Testing Embedded Memory Cores by
  • W., Li
  • Lee, K. J
Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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A Built-In Current Sensor Based on Current-Mode Design. by
  • Lee, K. J
  • Tang, J. J
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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