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		Cost Effective Deterministic Partitioning for Rapid Diagnosis in Scan -Based Bist by Orailoglu, Alex Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Efficient Self-Recovering Asic Design. by Hamilton, Samuel N Orailoglu, Alex Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Computer-Aided Design of Fault-tolerant Vlsi Systems. by Karri, Ramesh Hogstedt, Karin Orailoglu, Alex Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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