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Testing and Analysis by
  • Harrod, Peter
  • Bertoino, Ricardo
Source: Ieee Transactions on Software Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Itc Keynote: Test InEmerging Intellectual Property Business. by
  • Saxby, Robin
  • Harrod, Peter
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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