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		Buffer Block Planning for Interconnect Planning Aand Prediction by Cong, Jason Stroobandt, D Campenhout, David Van Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Collection and Analysis of Microprocessor Design Errors. by Hayes, John P Mudge, Trevor Campenhout, David Van Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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