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Nonmelt Laser Annealing of 5-Ke V and 1-Ke V Boron-Implanted Silicon by
  • Earles, S
  • Law, M
  • Brindos, R
  • Jones, K
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Creep Modeling of Welded Joints UsingTheta Projection Concept and Finite Elements Analysis. by
  • Snowden, K
  • Payten, W
  • Law, M
Source: Transactions ofAsme, Journal of Pressure Vessel Technology
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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