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Testing for Deep-Submicron Ics: by
  • Chen, Z. D
  • Wei, L
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Eficient Algoritm for 2-D Arithmetic Fourier Trans for m. by
  • Chen, Z. D
  • Chen, N. X
  • Ge, X. J
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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