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		25 to 300 0c Ultra-Low-Power Voltage Reference Compatible with Standard Soi Cmos Process by Adriaensen, S Dessard, V Source: IET:IEE: Electronics Letters Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Soi N-Mosfet Low-Frequency Noise Measurements and Modeling from Room Temperature Up to 250 C by Dessard, V Iniguez, B Adriaensen, S Flandre, D Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Integrated Sensor and Electronic Circuits in Fully Depleted Soi Technology for High-Temperature Applications by Demeus, L Dessard, V Viviani, A Adriaensen, S Source: IEEE Transactions on Industrial Electronics Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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