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Fast Feature Extraction Method for Robust Face Verification by
  • Sanderson, C
  • Paliwal, K. K
Source: IET:IEE: Electronics Letters
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Jbidirectional Recurrent Neural Networks. by
  • Paliwal, K. K
  • Schuster, M
Source: Ieee Transactions on Signal Processing
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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