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Approximation of Snr Degradation Due to Carrier Frequency offest for ofdm in Shadowed Multipath Channels by
  • Hwang, W
Source: Ieee Communications Letters
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Finite Element Analysis of Calibration Factors for Modified Incremental Strain Method by
  • Hwang, W
  • Suh, C. J
Source: The Journal of Strain Analysis for Engineering Design
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Performance Analysis of Tapered Gate in Pd/Soi Cmos Technology. by
  • Hwang, W
  • Chaung, C.T
  • Curran, B.W
  • Rosenfield, M.G
Source: International Journal of Electronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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