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		Thickness Dependent Dielectric Breakdown of Pecvd Low-K Carbon Doped Silicon Dioxide Dielectric Thin Films: Modeling and Experiments by Zhou, H Shi, F.G Zhao, Banghua Source: Microelectronics Journal Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Optical Properties of Pecvd Dielectric Thin Films: Thickness and Deposition Method Depdence by Zhou, H Source: Microelectronics Journal Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Thickness Dependent Glass Transition Temperature of Pecvd Low-K Dielectric Thin Films: Effect of Deposition Methods by Zhou, H Kim, H.K Shi, F.G Source: Microelectronics Journal Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Problem withChaotic Inverse System Encryption Approach. by Ling, X.T Zhou, H Source: Ieee Transactions on Circuits and Systems, I: Fundamental Theory and Applications Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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