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Pridicting Defect-tolerent Yield InEmbedded Core Context by
  • Meyer, F.J
  • Park, Nohpill
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Design Verification of Fpga Implementations. by
  • Chen, Xiao-Tao
  • Huang, Wei-Kang
  • Park, Nohpill
  • J.Meyer, Fred
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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