Determination of Interface and Bulk Traps InSubthreshold Region of Polycrystalline Silicon Thin-Film Transistors

By: Material type: ArticleArticleDescription: 1991-1994 pSubject(s): In: Ieee Transactions on Electron Devices
Holdings
Item type Current library Call number Vol info Status Date due Barcode
Articles Articles Periodical Section Vol.50, No.09 (Sep. 2003) Available