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An Analytical Equation for Oscillation Frequency of High-Frequency Ring Oscillators by
  • Sachdev, Manoj
  • Docking, Stephen
Source: Ieee Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Continyous Time Common Mode Feedback Technique for Sub 1 V Analogue Circuits by
  • Maymandi-Nejad, M
  • Sachdev, Manoj
Source: IET:IEE: Electronics Letters
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Current-Based Testing for Deep-Submicron Vlsis. by
  • Sachdev, Manoj
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Configurations for I -Testable Plas. by
  • Sachdev, Manoj
  • Kerkhoff, Hans
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Open Defect in Cmos Ram Address Decoders. by
  • Sachdev, Manoj
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Testing Defects in Scan Chains. by
  • Sachdev, Manoj
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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