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Stability Analysis of Current Programmed A-Si: H Amoled Pixel Circuits by
  • Sakariya, Kapil
  • Servati, Peyman
  • Nathan, A
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Above-Threshold Parameter Extraction and Modeling for Amorphous Silicon Thin-Film Transistors by
  • Servati, Peyman
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Static Characteristics of A-Si:H Dual Gate Tfts by
  • Servati, Peyman
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Modeling ofReverse Characteristics of A- Si: H Tfts by
  • Servati, Peyman
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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