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Band Diagram and Carrier Conduction Mechanisms in Zro2 Mis Structures by
  • Yamaguchi, Takahiro
  • Satake, H
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Suppression of Stress-Induced Leakage Current after Fowler-Nordheim Stressing By Deuterium Pyrogenic Oxidation and Deuterated Poly-Si Deposition by
  • Mitani, Y
  • Satake, H
  • Itoh, H
  • toriumi, A
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
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