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Design of Testable Structures Defined by Simple Loops by
  • Abraham, Jacob A
  • Gajski, Daniel D
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Analog Testing with Time Response Parameters. by
  • Balivada, Ashok
  • Chen, Jin
  • Abraham, Jacob A
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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