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An Optimal Design of Accelerated life Test for Exponential Distribution by
  • Chung, S W
  • Bai, D S
Source: Reliability Engineering and System Safety
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Measurements of A Fabricated Micro Mirror Using A Lateral-Effect Position-Sensitive Photodiode. by
  • Chung, S. W
  • Kim, Y. K
Source: IEEE Transactions on Industrial Electronics
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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