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		A Reconfiguration Scheme for Yield Enhancement of Large Area Binary Tree Architectures by Howelis, W. G. J Agarwal, Vindo K Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		onComplexity of Single Fault Set Diagnosability and Diagnosis Problems by Somani, Arun K Agarwal, Vindo K Avis, David Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Multiple Fault Testing of Large Circuits by Single Fault Test Sets by Agarwal, Vindo K Sridhar, Thirumalai Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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