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		A Data Compression Technique for Built-In Self-Test by Reddy, Sudhakar M Saluja, K. K Karpovsky, Mark Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		onDesign of Pseudoexhaustive Testable Plas by Ha, D. S Reddy, Sudhakar M Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		onDesign of Fault-Tolerant Two-Dimensional Systolic Arrays for Yield Enhancement by Kim, Jung Hwan Reddy, Sudhakar M Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Fault-Tolerant Communication Architecture for Distributed Systems by Pradhan, Dhiraj K Reddy, Sudhakar M Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Testable Design of Iterative Logic Arrays by Reddy, Sudhakar M ParthaSARathy, R Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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