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New Insights InRelation Relatio Between Electron Trap Generation andStatistical Properties of Oxide Breakdown by
  • Degraeve, Robin
  • Groeseneken, G
  • Ogier, J. L
  • Maes, Herman E
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Hot Hole Degradation Effects in Lateral Ndmos Transistors by
  • Moens, Peter
  • Tack, Marnix
  • Degraeve, Robin
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Analytical Percolation Model for Predicting Anomalous Charge Loss in Flash Memories by
  • Degraeve, Robin
  • Schuler, F
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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