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Giant Isotope Effect in Hot Electron Degradation of Metal Oxide Silicon Devices by
  • Hess, K
  • Kizilyalil, Lsik C
  • Lyding, Joseph W
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Mosfet Degradation Kinetics and Its Simulation by
  • Penzin, Oleg
  • Haggag, A
  • Hess, K
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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