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Investigation of Oxide Charge Trapping and Detrapping in a Mosfet by Using a Gldl Current Technique by
  • Wang, Tahui
  • Chang, Tse-En
  • Bess, Vicki
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Evaluating Microbiology. by
  • Bess, Vicki
Source: Biocycle
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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