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		Bulk Defect Induced Low-Frequency Noise in N P Silicon Diodes by Hou, Fan-Chi Simoen, Eddy Claeys, C Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		onGeometry Dependence OfNoise in Cmos Compatible Junction Diodes by Simoen, Eddy Claeys, C Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Linear Kink Effect Induced By Electron Valence Band Tunneling in Ultrathin Gate Oxide Bulk and Soi Mosfets by Rafi, J M Simoen, E Claeys, C Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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