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Post-Stress Trap Generation Induced by Oxide-Field Stress with Fn Injection by
  • Chen, T.P
  • li, Stelia
  • Fung, S
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Influence of Stress Ratio and Stress Pathon Behavior of Loose Decomposed Granite by
  • Charles, W
  • Fung, S
Source: Asce: Journal of Geotechnical and Geoenvironmental Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Reproducibility of Transmission Line Measurement of Bipolar I-V Characteristics of Mosfet'S. by
  • Chen, T.P
  • Chen, R
  • Fung, S
Source: Ieee Transactions on Instrumentation and Measurement
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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