Your search returned 2 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
A New Model for Field Dependence of Intrinsic and Extrinsic Time-Dependent Dielectric Breakdown by
  • Degraeve, R
  • Ogier, J. L
  • Groeseneken, G
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
New Insights InRelation Relatio Between Electron Trap Generation andStatistical Properties of Oxide Breakdown by
  • Degraeve, Robin
  • Groeseneken, G
  • Ogier, J. L
  • Maes, Herman E
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Pages