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		An Alternative Interpretation of Hot Electron Interface Degradatio in Nmosfet'S Isotope Results Irreconcilable with Major Defect Generation by Hess, Karl Lee, Jung-Ju Suh, Kwang-Pyuk Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Effective Material Properties and Themal Stress Analysis of Epoxy Molding Compound in Electronic Packaging by Shin, Dong-Kwang Lee, Jung-Ju Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Phase-Shifted Transmission/Reflection-Type Hybrid Extrinsic Fabry-Perot Interferometric Optical Fiber Sensors by Kim, Sun-Hoon Lee, Jung-Ju Source: Journal of Lightwave Technology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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