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		A Comprehensive Study of Hot Carier Stress-Induced Drain Leakage Current Degradation in Thin-Oxide N-Mosfet'S by Wang, Tahui Chiang, Lu-Ping Zous, Nian-Kai Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Investigation of Oxide Charge Trapping and Detrapping in a Mosfet by Using a Gldl Current Technique by Wang, Tahui Chang, Tse-En Bess, Vicki Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Characterization of Various Stress-Induced Oxide Traps in Mosfet'S by Using a Subthreshold Transient Current Technique by Wang, Tahui Ching, Lu-Ping Huang, Chimoon Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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