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		Impact of Scaling Silicon Film Thickness and Channel Width on Soi Mosfedt with Reoxidized Mesa Isolation by Fung, Samuel K. H Chan, Mansun Ko, Pink K Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Unified Understanding on Fuliy-Depleted Soi Nmosfet Hot-Carrier Degradation by Banna, Srinivasa R Chan, Philip C. H Fung, Samuel K. H Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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