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Computer Architecture and Organization by
  • Hayes, John P [author]
Series: McGraw-Hill Series in Computer Organization and Architecture
Edition: 2nd
Material type: Text Text
Language: English
Publication details: New York : McGraw-Hill, c1988
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 004.22 HAY.
Digital System Design and Microprocessors by
  • Hayes, John P [author]
Series: McGraw-Hill Series in Computer Organization and Architecture
Material type: Text Text
Language: English
Publication details: New York : McGraw-Hill Book, c1984
Online access:
Availability: Items available for loan: Reference Section (1)Location, call number: Reference Section 621.381958 HAY.
Computer Architecture and Organization by
  • Hayes, John P [author]
Material type: Text Text
Language: English
Publication details: New York : McGraw-Hill, c1978
Online access:
Availability: Items available for loan: Circulation Section (3)Location, call number: Circulation Section 004.22 HAY, ...
Computer Architecture and Organization by
  • Hayes, John P [author]
Edition: 2nd
Material type: Text Text
Language: English
Publication details: New York : McGraw-Hill, c1988
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 004.22 HAY.
Introduction to Digital Logic Design by
  • Hayes, John P [author]
Material type: Text Text
Language: English
Publication details: Reading, Massachusetts : Addison-Wesley, c1993
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.395 HAY.
Digital System Design and Microprocessors by
  • Hayes, John P [author]
Material type: Text Text
Language: English
Publication details: New York : McGraw-Hill Book, c1985
Online access:
Availability: Items available for loan: Circulation Section (1)Location, call number: Circulation Section 621.381958 HAY.
Fault-Tolerance of Dynamic-Fuli-Access Interconnection Networks by
  • Shen, John Paul Shen
  • Hayes, John P
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Design of Easily Testable Bit-Sliced Systems by
  • Hayes, John P
  • Sridhar, Thirumalai
Source: IEEE Transactions on Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Transpaent Recovery from Intermittent Faults in Time-Triggered Distributed Systems by
  • Kandasamy, K
  • Hayes, John P
Source: IEEE TransactionsonComputers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Collection and Analysis of Microprocessor Design Errors. by
  • Hayes, John P
  • Mudge, Trevor
  • Campenhout, David Van
Source: Ieee Design and Test of Computers
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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