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		A New Approach for Characterizing Structure-Dependent Hot-Carrier Effects in Drain-Engineered Mosfet'S by Chung, S.T Yang, Jiuun-Jer Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A New Technique for Hot Carrier Reliability Evaluations of Flash Memory Celi After Long-Term Program/Erase Cycles by Chung, S.T Yih, Cherng-Ming liang, Mong-Song Source: IEEE Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Morphology and Mechanical Properties of Injection Molded Articles with Weld-lines by Kim, Jin Kon Song, Ju Ho Chung, S.T Kwon, T.H Source: Polymer Engineering and Science Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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