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Shaliow Source Drain Extrnsion Effects on External Resistance in Sub-0-1 Mosfet by
  • Choi, Chang-Hoon
  • Goo, J S
  • Yu, Zhi
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Resonant Gate Tunneling Current in Double-Gate Soi: A Simulation Study by
  • Choi, Chang-Hoon
Source: Ieee Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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