Your search returned 3 results.

Sort
Unhighlight Highlight
Select all Clear all
Select titles to:
Results
Thermal Coupling in Integrated Circuits: Application to Thermal Testing by
  • Altet, Josep
  • Rubio, Antonio
  • Schaub, Emmanuel
Source: IEEE Journal of Solid-State Circuits
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Calibration-Free Heat Source Localisation in Ics Entirely Convered By Metal Layers by
  • Altet, Josep
Source: IET:IEE: Electronics Letters
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Four Different Approaches for Measurement of Ic Surface Temperature: Application to Thermal Testing by
  • Altet, Josep
Source: Microelectronics Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Request article
Pages