Your search returned 6 results.

Results
		Analysis of Stratified Testing for Multichip Module Systems by Park, Nohpili Lombardi, Fabrizio Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Maximal Diagnosis of Interconnects of Random Access Memories by Zhao, Jun Meyer, F.J Lombardi, Fabrizio Park, Nohpili Source: IEEE Transactions on Reliability Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Modeling Intermediate Tests for Fault-Tolerant Multichip Module Systems by Kim, Sungsoo Lombardi, Fabrizio Source: IEEE Transactions on Components, Packaging, and Manufacturing Technology Part-B: Advanced Packaging Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		on Functional Testing of Array Processors by Sciuto, Donatelia Lombardi, Fabrizio Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Testing of Quantum Cellular Automata by Lombardi, Fabrizio Tahoori, Mehdi B Source: Ieee Transactions on Nanotechnology Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Guest Editors' Introduction:Dram Architecture and Testing. by F.Cockburn, Bruce Lombardi, Fabrizio J.Meyer, Fred Source: Ieee Design and Test of Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

Report a problem