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Analysis of Stratified Testing for Multichip Module Systems by
  • Park, Nohpili
  • Lombardi, Fabrizio
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
Maximal Diagnosis of Interconnects of Random Access Memories by
  • Zhao, Jun
  • Meyer, F.J
  • Lombardi, Fabrizio
  • Park, Nohpili
Source: IEEE Transactions on Reliability
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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