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Using Bayesian Networks to Predict Software Defects and Reliability by
  • Fenton, N
  • Neil, M
  • Marquez, D
Source: Journal of Risk and Reliability: Proceedings OfI Mech E Part-O
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Lessons from Using Z to Specify a Software Tool by
  • Neil, M
  • Ostrolenk, Gary
  • Southworth, Mark
Source: IEEE Transactions on Software Engineering
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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