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		The Impact of Low-Holding-Voltage Issue in High-Voltage Cmos Technology andDesign of Latchup-Free Power-Rail Esd Clamp Circuit for Lcd Driver Ics by Ker, Ming-Dou lin, Kun-Hsien Source: IEEE Journal of Solid-State Circuits Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		on-Chip Esd Protection Design with Substrate-Triggered Technique for Mixed-Voltage I/O Circuits in Subquarter-Micrometer Cmos Process by Ker, Ming-Dou Chuang, Chien-Hui Lin, Kun-Hsien Source: Ieee Transactions on Electron Devices Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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