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Separation and Quantificatio of Parasitic Resistance in Nano-Scale Silicon Mosfet by
  • Lee, Jun-Ha
  • Lee, Hoong-Joo
  • Song, Young-Jin
Source: International Transactions on Electrophysics and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Novel Design Methodology Using Automated Model Parameter Generation by Virtual Device Fabrication by
  • Lee, Jun-Ha
  • Lee, Hoon Joo
Source: International Transactions on Electrophysics and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Analysis and Calibration of Transient Enhanced Diffusion for Indium Impurity in Nanoscale Semiconductor Devices by
  • Lee, Jun-Ha
  • Lee, Hoong-Joo
Source: International Transactions on Electrophysics and Applications
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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