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Investigation of Interface Shear Transfer Using Push through Tests by
  • Wiliams, Christopher S
  • Massey, Joshua B
  • Jirsa, James O
Source: ACI Structural Journal
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Scaling Trends for Device Performance and Reliability in Cfhannel-Engineered N-Mosfets' by
  • Wiliams, Christopher S
  • littlejohn, M. A
  • Holton, Wililam C
Source: IEEE Transactions on Electron Devices
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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