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The Application of Neural Networks toPapermaking Industry. by
  • Edwards, P.J
  • Murray, A.F
  • Papadopoulos, G
  • Wallace, A.R
Source: Ieee Transactions on Neural Networks
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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Fault tolerance Via Weight Noise in Analogy Vlsi Implementations of Mlp'S - A Case Study with Epsilon. by
  • Murray, A. F
  • Edwards, P. J
Source: Ieee Transactions on Circuits and Systems-Ii: Express Briefs ( for merly: Analog & Digital Signal Processing)
Material type: Article Article; Format: print
Availability: Items available for loan: Engr Abul Kalam Library (1).
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