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		on Self-Fault Diagnosis OfDistributed Systems by Hosseini, Seyed Hossein Kuhl, Jon G Reddy, S.M Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A March Test for Functional Faults in Semiconductor Random Access Memories by Reddy, S. M Suk, D.S Source: IEEE Transactions on Computers Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		A Built-In Self-Test Method for Diagnosis of Synchronous Sequential Circuits by Pomeranz, I Reddy, S. M Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		Resynthesis of Combinational Logic Circuits for Improved Path Delay Fault Testability Using Comparison Units by Pomeranz, I Reddy, S. M Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article
		on Methods to Match A Test Pattern Generator to A Circuit-Under-Test. by Reddy, S.M Pomeranz, I Source: Ieee Transactions on Very Large Scale Intergration (Vlsi) Systems Material type: Article; Format: print Availability: Items available for loan: Engr Abul Kalam Library (1). Request article

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